VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

Författare
(Edited by Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh.)
Språk
Engelska
Förlag År Ort Om boken ISBN
Springer Singapore, Imprint: Springer 2017 Singapore, Singapore XXI, 815 sidor. 486 illus. online resource. 978-981-10-7470-7